The core activity of NanoWorld AG is the development, manufacture and distribution of scanning probes for atomic force microscopy (AFM), in particular AFM tips and probes, which are used in various fields such as nanoscience, materials science, physics, biology and life sciences.
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AFM probes for contact, tapping and non-contact mode, force modulation, bio-/life-science, high-speed scanning, electrical and magnetic applications, and high-resolution and high-aspect-ratio probes.
AFM Probes (POINTPROBE®)
Silicon AFM probes with very high resolution, a typical tip below 8 nm, a guaranteed tip below 12 nm, and various tip shapes.
AFM Probes (ARROW™)
Silicon AFM probes with high tip visibility, three-sided tip geometry, symmetrical scans, and a high-speed scanning version up to 2 MHz.
Ultra-Short Cantilevers
Ultra-short cantilevers for high-speed scanning AFM, with high resonance frequencies, different spring constants, and a wear-resistant HDC/DLC AFM tip.
AFM Probes (Pyrex-Nitride)
Silicon nitride AFM cantilevers and tips for contact or dynamic modes, with etched pyramidal tips and an optional tipless version.
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